A technique is presented for mapping the strain in light-emitting nano- and hetero-structures using near-field spectroscopy. This technique makes use of theoretical calculations to extract the strain from near-field data.
© 2011 OSA
A. Llopis, S. Pereira, I. M. Watson, A. Krokhin, and A. Neogi, "Nano-scale Strain Mapping using Near-field Spectroscopy," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper CMV6.
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