Using THz spectroscopy, we obtained the resistivity of Ni-Ti alloy thin-films as a function of Ti concentration. The resistivity sharply increases near the phase transition boundaries, Ti concentrations of 22%, 44% and 62%.
© 2011 OSA
A. D. Jameson, J. L. Tomaino, J. Kevek, M. Hemphill-Johnston, J. Ong, M. D. Koretsky, E. D. Minot, and Y. Lee, "Terahertz Spectroscopy of Ni-Ti Alloy Thin Films," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper CThEE3.
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