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Conference Paper
CLEO: Science and Innovations
Baltimore, Maryland United States
May 1-6, 2011
ISBN: 978-1-55752-910-7
THz Spectroscopy (CThEE)

Terahertz Spectroscopy of Ni-Ti Alloy Thin Films

Andrew D. Jameson, Joseph L. Tomaino, Joshua Kevek, Meghan Hemphill-Johnston, Justin Ong, Milo D. Koretsky, Ethan D. Minot, and Yun-Shik Lee  »View Author Affiliations


http://dx.doi.org/10.1364/CLEO_SI.2011.CThEE3


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Abstract

Using THz spectroscopy, we obtained the resistivity of Ni-Ti alloy thin-films as a function of Ti concentration. The resistivity sharply increases near the phase transition boundaries, Ti concentrations of 22%, 44% and 62%.

© 2011 OSA

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(320.7150) Ultrafast optics : Ultrafast spectroscopy
(300.6495) Spectroscopy : Spectroscopy, teraherz

Citation
A. D. Jameson, J. L. Tomaino, J. Kevek, M. Hemphill-Johnston, J. Ong, M. D. Koretsky, E. D. Minot, and Y. Lee, "Terahertz Spectroscopy of Ni-Ti Alloy Thin Films," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper CThEE3.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO_SI-2011-CThEE3


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