Using scanning probe microscopy with modulated illumination, we demonstrate simultaneous measurement of topography and optical forces exerted on a probe. Broadband optical field detection is possible using a single probe.
© 2013 OSA
D. C. Kohlgraf-Owens, L. Greusard, S. Sukhov, Y. De Wilde, and A. Dogariu, "Broadband Near-Field Detection with Multi-Frequency Probe Microscopy," in CLEO: 2013, OSA Technical Digest (online) (Optical Society of America, 2013), paper QM1B.5.
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