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Optics InfoBase > Conference Papers > CLEO_QELS > 2013 > QM1B > Page QM1B.5 © 2013 OSA

Conference Paper
CLEO: QELS_Fundamental Science
San Jose, California United States
June 9-14, 2013
ISBN: 978-1-55752-972-5
Near-field Imaging & Spectroscopy (QM1B)

Broadband Near-Field Detection with Multi-Frequency Probe Microscopy

Dana C. Kohlgraf-Owens, Léo Greusard, Sergey Sukhov, Yannick De Wilde, and Aristide Dogariu  »View Author Affiliations

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Using scanning probe microscopy with modulated illumination, we demonstrate simultaneous measurement of topography and optical forces exerted on a probe. Broadband optical field detection is possible using a single probe.

© 2013 OSA

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(180.4243) Microscopy : Near-field microscopy
(120.4880) Instrumentation, measurement, and metrology : Optomechanics

D. C. Kohlgraf-Owens, L. Greusard, S. Sukhov, Y. De Wilde, and A. Dogariu, "Broadband Near-Field Detection with Multi-Frequency Probe Microscopy," in CLEO: 2013, OSA Technical Digest (online) (Optical Society of America, 2013), paper QM1B.5.

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