Examining Nanoscale Photovoltaics with High Brightness Fourier Transform Measurements

Matthew Y. Sfeir; Fernando E. Camino; Chang-Yong Nam; Charles T. Black

doi:10.1364/CLEO_QELS.2013.QTu2O.4

CLEO: 2013
OSA Technical Digest (online) (Optica Publishing Group, 2013),
paper QTu2O.4
•https://doi.org/10.1364/CLEO_QELS.2013.QTu2O.4

Examining Nanoscale Photovoltaics with High Brightness Fourier Transform Measurements

Matthew Y. Sfeir, Fernando E. Camino, Chang-Yong Nam, and Charles T. Black

CLEO: QELS_Fundamental Science 2013

San Jose, California United States
9–14 June 2013
ISBN: 978-1-55752-972-5

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Optical Processes in Semiconductor Nanostructures (QTu2O)

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M. Y. Sfeir, F. E. Camino, C. Nam, and C. T. Black, "Examining Nanoscale Photovoltaics with High Brightness Fourier Transform Measurements," in CLEO: 2013, OSA Technical Digest (online) (Optica Publishing Group, 2013), paper QTu2O.4.

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Abstract

We describe a new Facility effort utilizing high brightness Fourier transform methods, including measurements of transmission, reflection, and photoconductivity spectra, to characterize nanomaterial-based model photovoltaic devices.

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