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Optics InfoBase > Conference Papers > CLEO_SI > 2011 > JThB > Page JThB67 © 2011 OSA

Conference Paper
CLEO: Science and Innovations
Baltimore, Maryland United States
May 1-6, 2011
ISBN: 978-1-55752-910-7
Nonlinear and Quantum Science and Measurements Joint Poster Session (JThB)

Full Characterization of Tightly Focused Vector Fields through Far Field Third Harmonic Signals

David Kupka and Randy Bartels  »View Author Affiliations


http://dx.doi.org/10.1364/CLEO_AT.2011.JThB67


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Abstract

A non-iterative algorithm applied on nanosphere induced far field third harmonic signals capable of retrieving the full vector third order polarization densities and fundamental field at the focal plane is presented.

© 2011 OSA

OCIS Codes
(110.6960) Imaging systems : Tomography
(290.3200) Scattering : Inverse scattering

Citation
D. Kupka and R. Bartels, "Full Characterization of Tightly Focused Vector Fields through Far Field Third Harmonic Signals," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper JThB67.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO_SI-2011-JThB67


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