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Conferences > CLEO_SI > 2011 > PDPB > PDPB2

OCT Imaging up to 760 kHz Axial Scan Rate Using Single-Mode 1310nm MEMS-Tunable VCSELs with >100nm Tuning Range

V. Jayaraman, J. Jiang, H. Li, P. J. S. Heim, G.D. Cole, B. Potsaid, J.G. Fujimoto, and A. Cable

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Abstract

We describe the first widely tunable, single-mode 1310nm MEMS VCSELs with >100nm tuning range, and the first application of these VCSELs to ultra-high-speed swept source OCT imaging at axial scan rates up to 760kHz.

© 2011 Optical Society of America

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OCT Imaging up to 760 kHz Axial Scan Rate Using Single-Mode 1310nm MEMS-Tunable VCSELs with >100nm Tuning Range

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