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Optics InfoBase > Conference Papers > CLEO_SI > 2013 > CM3N > Page CM3N.3 © 2013 OSA

Conference Paper
CLEO: Science and Innovations
San Jose, California United States
June 9-14, 2013
ISBN: 978-1-55752-972-5
Attosecond & XUV Metrology (CM3N)

Keyhole Coherent Diffraction Imaging of an Extended Transparent Sample Using Curved Multilayer Mirrors

Matthew Seaberg, Bosheng Zhang, Justin Shaw, Dennis F. Gardner, daniel adams, Margaret M. Murnane, and Henry Kapteyn  »View Author Affiliations


http://dx.doi.org/10.1364/CLEO_SI.2013.CM3N.3


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Abstract

We use keyhole coherent diffraction imaging to gain ~20x increase in flux and fully characterize the illumination, allowing us to image a semi-transparent sample in amplitude and phase. This capability is important for x-ray microscopes.

© 2013 OSA

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.7460) Microscopy : X-ray microscopy
(190.2620) Nonlinear optics : Harmonic generation and mixing

Citation
M. Seaberg, B. Zhang, J. Shaw, D. F. Gardner, d. adams, M. M. Murnane, and H. Kapteyn, "Keyhole Coherent Diffraction Imaging of an Extended Transparent Sample Using Curved Multilayer Mirrors," in CLEO: 2013, OSA Technical Digest (online) (Optical Society of America, 2013), paper CM3N.3.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO_SI-2013-CM3N.3

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