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Optics InfoBase > Conference Papers > CLEO_SI > 2013 > CTu2I > Page CTu2I.2 © 2013 OSA

Conference Paper
CLEO: Science and Innovations
San Jose, California United States
June 9-14, 2013
ISBN: 978-1-55752-972-5
Frequency Combs: Applications (CTu2I)

Dual-Comb Metrology for Semiconductor Optical Frequency Comb Characterization

Anthony Klee, Josue Davila-Rodriguez, Charles Williams, and Peter J. Delfyett  »View Author Affiliations


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Spectrally efficient dual-comb detection is utilized for self-referenced measurements of spectral phase of three distinct semiconductor frequency combs. The higher-order phase is quantified for each, elucidating the dispersive properties of the gain and fiberized cavities.

© 2013 OSA

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(140.5960) Lasers and laser optics : Semiconductor lasers

A. Klee, J. Davila-Rodriguez, C. Williams, and P. J. Delfyett, "Dual-Comb Metrology for Semiconductor Optical Frequency Comb Characterization," in CLEO: 2013, OSA Technical Digest (online) (Optical Society of America, 2013), paper CTu2I.2.

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