A simple and robust technique to extract the complex optical conductivity of truly two-dimensional materials is developed. Applying the method to chemical-vapor-deposited graphene, we extract the complex conductivity, including Fermi level and scattering time.
© 2014 OSA
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.4236) Materials : Nanomaterials
Y. Chang, C. Liu, Z. Zhong, and T. Norris, "Extracting the complex optical conductivity of true two-dimensional layers by ellipsometry," in CLEO: 2014, OSA Technical Digest (online) (Optical Society of America, 2014), paper SM3H.2.
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