We present a microscopy technique in which a scattering optical element is used for scanning and resolution enhancement. The measured backscattering matrix is used to scan light with a twofold improvement in system resolution.
© 2011 OSA
D. B. Conkey, A. Caravaca, and R. Piestun, "Backscattering Scanning Fluorescence Microscopy," in Imaging and Applied Optics, OSA Technical Digest (CD) (Optical Society of America, 2011), paper CTuA2.
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