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Conference Paper
Computational Optical Sensing and Imaging
Toronto Canada
July 10-14, 2011
ISBN: 978-1-55752-914-5
Imaging with Scattering and Aberrations (CTuA)

PSF Engineering to Reduce the Impact of Depth-Induced Aberrations on Wide-field Microscopy Imaging

Shuai Yuan and Chrysanthe Preza  »View Author Affiliations


http://dx.doi.org/10.1364/COSI.2011.CTuA3


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Abstract

We evaluated different phase mask designs for PSF engineering using wavefront encoding, to reduce the impact of depth-induced aberrations, due to refractive index mismatch, on 3D computational wide-field microscopy imaging with high NA lenses.

© 2011 OSA

OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.1758) Imaging systems : Computational imaging
(110.7348) Imaging systems : Wavefront encoding

Citation
S. Yuan and C. Preza, "PSF Engineering to Reduce the Impact of Depth-Induced Aberrations on Wide-field Microscopy Imaging," in Imaging and Applied Optics, OSA Technical Digest (CD) (Optical Society of America, 2011), paper CTuA3.
http://www.opticsinfobase.org/abstract.cfm?URI=COSI-2011-CTuA3


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