Abstract
Baggage inspection in security applications requires fast and accurate scanning systems. High performance of x-ray scatter imaging requires accurate knowledge of x-ray attenuation. We describe the design considerations for such systems that combine three-dimensional attenuation estimation with x-ray scatter imaging.
© 2014 Optical Society of America
PDF Article | Presentation VideoMore Like This
H. Balacey, J.-B. Perraud, J. Bou Sleiman, B. Recur, and P. Mounaix
MS3_2 International Symposium on Ultrafast Phenomena and Terahertz Waves (ISUPTW) 2014
Yuzuru Takashima, Jihun Kim, Yao-Te Cheng, Max Yuen, Jeffrey Wilde, and Lambertus Hesselink
JTh2A.136 CLEO: Applications and Technology (CLEO:A&T) 2014
Yuzuru Takashima, Jihun Kim, Yao-Te Cheng, Max Yuen, and Lambertus Hesselink
IM2B.2 International Optical Design Conference (IODC) 2014