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Conference Paper
Digital Holography and Three-Dimensional Imaging
Vancouver Canada
April 26-30, 2009
ISBN: 978-1-55752-871-1
DH/FTS/HISE/NTM/OTA Joint Poster Session (JTuB)

On-Axis Phase-Shifting Profilometry with Two Spatial Frequencies Using Concentric-Circular Patterns

Eun-Hee Kim, Joonku Hahn, and Byoungho Lee


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On-axis phase-shifting profilometry with two spatial frequencies is proposed. The carrier frequency results from the difference in positions of camera and projector on common axis. We use concentric-circular patterns to extract the depth of objects.

© 2009 The Optical Society

OCIS Codes
(100.0100) Image processing : Image processing
(110.0110) Imaging systems : Imaging systems
(110.6880) Imaging systems : Three-dimensional image acquisition
(100.3175) Image processing : Interferometric imaging

E. Kim, J. Hahn, and B. Lee, "On-Axis Phase-Shifting Profilometry with Two Spatial Frequencies Using Concentric-Circular Patterns," in Advances in Imaging, OSA Technical Digest (CD) (Optical Society of America, 2009), paper JTuB7.

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