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Conference Paper
Education and Training in Optics and Photonics
Tucson, Arizona United States
October 6, 2003
ISBN: 1-55752-759-8
Poster Session (EMI)

Method to make accurate measurements of refractive index

Carlos Ignacio Robledo-Sánchez and Nazario Bautista-Elivar

http://dx.doi.org/10.1364/ETOP.2003.EMI8


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Abstract

In this work we use a diffraction grating to calculate the wavelength inside a transparent material of parallel plane faces, with the purpose of measuring the magnitude of their refraction index.

© 2003 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1950) Diffraction and gratings : Diffraction gratings
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology

Citation
C. I. Robledo-Sánchez and N. Bautista-Elivar, "Method to make accurate measurements of refractive index," in Education and Training in Optics and Photonics, OSA Technical Digest Series (Optical Society of America, 2003), paper EMI8.
http://www.opticsinfobase.org/abstract.cfm?URI=ETOP-2003-EMI8


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