We describe the use of stochastic resonance enhanced thermoreflectance imaging for characterizing and locating defects including shunts and microcracks in multicrystalline silicon solar cells.
© 2009 The Optical Society
(100.0100) Image processing : Image processing
(100.2980) Image processing : Image enhancement
(110.0110) Imaging systems : Imaging systems
(110.2970) Imaging systems : Image detection systems
J. A. Hudgings and K. D. McCarthy, "Stochastic Resonance Enhanced Imaging for Defect Location in Silicon Solar Cells," in Optics and Photonics for Advanced Energy Technology, OSA Technical Digest (CD) (Optical Society of America, 2009), paper WC2.
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