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Conference Paper
Fabrication and Testing of Aspheres
Washington D. C. United States
January 1, 1999
ISBN: 1-55752-557-9
Testing (T)

Synchrotron radiation and x-ray mirror metrology with the long trace profiler

Peter Z. Takacs, Shinan Qian, and Haizhang Li


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No abstract available.

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(220.1250) Optical design and fabrication : Aspherics
(340.7470) X-ray optics : X-ray mirrors

P. Z. Takacs, S. Qian, and H. Li, "Synchrotron radiation and x-ray mirror metrology with the long trace profiler," in Fabrication and Testing of Aspheres, J. Taylor, M. Piscotty, and A. Lindquist, eds., Vol. 24 of OSA Trends in Optics and Photonics (Optical Society of America, 1999), paper T8.

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