No abstract available.
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(220.1250) Optical design and fabrication : Aspherics
(340.7470) X-ray optics : X-ray mirrors
P. Z. Takacs, S. Qian, and H. Li, "Synchrotron radiation and x-ray mirror metrology with the long trace profiler," in Fabrication and Testing of Aspheres, J. Taylor, M. Piscotty, and A. Lindquist, eds., Vol. 24 of OSA Trends in Optics and Photonics (Optical Society of America, 1999), paper T8.
References are not available for this paper.