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Conference Paper
Fourier Transform Spectroscopy
Alexandria, Virginia United States
January 31, 2005
ISBN: 1-55752-780-6
FTS Poster Session (FTuD)

Instrument Parameters Estimation from ILS Characterization Measurements

Jean-Pierre Bouchard and Pierre Tremblay

http://dx.doi.org/10.1364/FTS.2005.FTuD2


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Abstract

The use of instrument line shape characterization to retrieve instrument parameters is investigated.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.0300) Spectroscopy : Spectroscopy
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

Citation
J. Bouchard and P. Tremblay, " Instrument Parameters Estimation from ILS Characterization Measurements," in Fourier Transform Spectroscopy/ Hyperspectral Imaging and Sounding of the Environment, Technical Digest (CD) (Optical Society of America, 2005), paper FTuD2.
http://www.opticsinfobase.org/abstract.cfm?URI=FTS-2005-FTuD2


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