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Optics InfoBase > Conference Papers > FiO > 2003 > MT > Page MT90 © 2003 OSA

Conference Paper
Frontiers in Optics
Tucson, Arizona United States
October 5, 2003
ISBN: 1-55752-759-8
Poster Session (MT)

Calibration of optical heterodyne system to measure microroughness

Rosario Baltazar and Cristina Solano

http://dx.doi.org/10.1364/FIO.2003.MT90


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No abstract available.

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.1170) Fourier optics and signal processing : Analog optical signal processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Citation
R. Baltazar and C. Solano, "Calibration of optical heterodyne system to measure microroughness," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2003), paper MT90.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2003-MT90

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