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Conferences > FiO > 2003 > WEE > WEE5

High accuracy directional/hemispherical measurement system for large samples

Georgi T. Georgiev and James J. Butler

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Abstract

The optical characterization of reflectance materials is usually performed by commercial spectrophotometers. Typical measurements are the specular and diffuse reflectance as function of wavelength. To better investigate the optical properties of those materials, it is useful to know their directional/hemispherical reflectance.

© 2003 Optical Society of America

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