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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 12, 2004
ISBN: 1-55752-779-2
Image Reconstruction II (FThP)

Rigorous analysis of diffraction by finite grating using FEM-based hybrid method: General case of oblique incidence

Mohamed A. Basha, S. Chaudhuri, and S. Safavi-Naeini

http://dx.doi.org/10.1364/FIO.2004.FThP6


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Abstract

We studied and investigated the problem of diffraction by finite grating using a rigorous hybrid FEM-based method. The method is based on analyzing only one grating cell and then combining the results with the geometry arrangements of the whole structure to determine the diffracted fields. The method is very fast, rigorous and robust and can be applied to general incident field on any general grating profile: dielectric or metallic.

© 2004 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1950) Diffraction and gratings : Diffraction gratings
(050.2770) Diffraction and gratings : Gratings

Citation
M. A. Basha, S. Chaudhuri, and S. Safavi-Naeini, "Rigorous analysis of diffraction by finite grating using FEM-based hybrid method: General case of oblique incidence," in Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing, OSA Technical Digest Series (Optical Society of America, 2004), paper FThP6.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2004-FThP6


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