Birefringence arises in optical interconnects due to residual stress. This affects reliability and performance. A new full-field retardation measurement method is presented and compared to the existing Brace-Köhler technique. Both methods are applied to retrieve the two-dimensional birefringence distribution of optical fibers and polymer waveguides.
© 2004 Optical Society of America
C. C. Montarou and T. K. Gaylord, "Low-level birefringence measurements applied to optical interconnects," in Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing, OSA Technical Digest Series (Optical Society of America, 2004), paper FThT4.