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Optics InfoBase > Conference Papers > FiO > 2004 > FThT > Page FThT4 © 2004 OSA

Conference Paper
Frontiers in Optics
Rochester, New York United States
October 12, 2004
ISBN: 1-55752-779-2
Chip-Scale Devices (FThT)

Low-level birefringence measurements applied to optical interconnects

Carole C. Montarou and Thomas K. Gaylord

http://dx.doi.org/10.1364/FIO.2004.FThT4


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Abstract

Birefringence arises in optical interconnects due to residual stress. This affects reliability and performance. A new full-field retardation measurement method is presented and compared to the existing Brace-Köhler technique. Both methods are applied to retrieve the two-dimensional birefringence distribution of optical fibers and polymer waveguides.

© 2004 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(230.7370) Optical devices : Waveguides
(260.1440) Physical optics : Birefringence

Citation
C. C. Montarou and T. K. Gaylord, "Low-level birefringence measurements applied to optical interconnects," in Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing, OSA Technical Digest Series (Optical Society of America, 2004), paper FThT4.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2004-FThT4

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