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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 12, 2004
ISBN: 1-55752-779-2
Novel Optical Materials (FTuS)

Birefringence in porous silicon structures

Jarkko J. Saarinen, J E. Sipe, Sharon M. Weiss, and Philippe M. Fauchet

http://dx.doi.org/10.1364/FIO.2004.FTuS6


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Abstract

We present a method for treating birefringent effects in layered media, and apply it to porous silicon structures. The approach is to characterize the fields in terms of s- and p-polarized amplitudes in each layer. The calculations then naturally employ Fresnel reflection and transmission coefficients for the anisotropic media.

© 2004 Optical Society of America

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(260.1180) Physical optics : Crystal optics
(260.2110) Physical optics : Electromagnetic optics

Citation
J. J. Saarinen, J. E. Sipe, S. M. Weiss, and P. M. Fauchet, "Birefringence in porous silicon structures," in Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing, OSA Technical Digest Series (Optical Society of America, 2004), paper FTuS6.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2004-FTuS6

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