We present a method for treating birefringent effects in layered media, and apply it to porous silicon structures. The approach is to characterize the fields in terms of s- and p-polarized amplitudes in each layer. The calculations then naturally employ Fresnel reflection and transmission coefficients for the anisotropic media.
© 2004 Optical Society of America
J. J. Saarinen, J. E. Sipe, S. M. Weiss, and P. M. Fauchet, "Birefringence in porous silicon structures," in Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing, OSA Technical Digest Series (Optical Society of America, 2004), paper FTuS6.