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  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest Series (Optica Publishing Group, 2004),
  • paper FTuS6
  • https://doi.org/10.1364/FIO.2004.FTuS6

Birefringence in porous silicon structures

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Abstract

We present a method for treating birefringent effects in layered media, and apply it to porous silicon structures. The approach is to characterize the fields in terms of s- and p-polarized amplitudes in each layer. The calculations then naturally employ Fresnel reflection and transmission coefficients for the anisotropic media.

© 2004 Optical Society of America

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