THz imaging and microscopy

Xi-Cheng Zhang

doi:10.1364/FIO.2004.JThA3

Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
OSA Technical Digest Series (Optica Publishing Group, 2004),
paper JThA3
•https://doi.org/10.1364/FIO.2004.JThA3

THz imaging and microscopy

Xi-Cheng Zhang

Frontiers in Optics 2004

Rochester, New York United States
12–15 October 2004
ISBN: 1-55752-779-2

From the session
THz Lasers: Developments and Applications I (JThA)

Open Access

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X. Zhang, "THz imaging and microscopy," in Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing, OSA Technical Digest Series (Optica Publishing Group, 2004), paper JThA3.

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Abstract

THz wave imaging has tremendous potential for inspection applications. Development of pulsed THz imaging technology provides a new method for defense and commercial applications. Recent developments of real-time (30 Hz), standoff distance (>25 meters), and diffraction-limited pulsed THz imaging focal-plane technology and the near-field THz microscopy are highlighted. Full-text article is not available.

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