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Optics InfoBase > Conference Papers > FiO > 2005 > FThQ > Page FThQ4 © 2005 OSA

Conference Paper
Frontiers in Optics
Tucson, Arizona United States
October 16-21, 2005
ISBN: 1-55752-797-0
Waveguides (FThQ)

Characterization of Transient Interference in a Single Mode Waveguide

Guangwei Yuan, Matthew D. Stephens, David S. Dandy, and Kevin L. Lear

http://dx.doi.org/10.1364/FIO.2005.FThQ4


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Abstract

Near-field scanning optical microscopy (NSOM) is used to directly measure transient interference between a guided and step induced leaky mode in a single mode waveguide.Simulations are in good agreement with the observed results.

© 2005 Optical Society of America

OCIS Codes
(230.7370) Optical devices : Waveguides
(260.3160) Physical optics : Interference

Citation
G. Yuan, M. D. Stephens, D. S. Dandy, and K. L. Lear, "Characterization of Transient Interference in a Single Mode Waveguide," in Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FThQ4.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2005-FThQ4


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