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Conference Paper
Frontiers in Optics
Tucson, Arizona United States
October 16-21, 2005
ISBN: 1-55752-797-0
Waveguides (FThQ)

Characterization of Transient Interference in a Single Mode Waveguide

Guangwei Yuan, Matthew D. Stephens, David S. Dandy, and Kevin L. Lear


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Near-field scanning optical microscopy (NSOM) is used to directly measure transient interference between a guided and step induced leaky mode in a single mode waveguide.Simulations are in good agreement with the observed results.

© 2005 Optical Society of America

OCIS Codes
(230.7370) Optical devices : Waveguides
(260.3160) Physical optics : Interference

G. Yuan, M. D. Stephens, D. S. Dandy, and K. L. Lear, "Characterization of Transient Interference in a Single Mode Waveguide," in Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FThQ4.

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