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Optics InfoBase > Conference Papers > FiO > 2006 > FMI > Page FMI4 © 2006 OSA

Conference Paper
Frontiers in Optics
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Computational Imaging II (FMI)

Strong Probe Scattering in NSOM

Jin Sun, Paul S. Carney, and John C. Schotland

http://dx.doi.org/10.1364/FIO.2006.FMI4


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Abstract

A strongly scattering probe tip is considered in near-field scanning optical microscopy assuming a weakly scattering sample. An effective tip strength is defined to characterize the tip scattering effect. Numerical and experimental results are shown.

© 2006 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(290.0290) Scattering : Scattering
(290.4210) Scattering : Multiple scattering

Citation
J. Sun, P. S. Carney, and J. C. Schotland, "Strong Probe Scattering in NSOM," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper FMI4.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2006-FMI4


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