A strongly scattering probe tip is considered in near-field scanning optical microscopy assuming a weakly scattering sample. An effective tip strength is defined to characterize the tip scattering effect. Numerical and experimental results are shown.
© 2006 Optical Society of America
J. Sun, P. S. Carney, and J. C. Schotland, "Strong Probe Scattering in NSOM," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper FMI4.
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