Abstract
A theory of multi-spectral intensity diffraction tomography (I-DT) is described. Unlike conventional I-DT that requires intensity measurements on a pair of detector planes, this method uses measurements on a single detector plane at two frequencies.
© 2006 Optical Society of America
PDF ArticleMore Like This
Mark A. Anastasio, Yin Huang, Daxin Shi, and Greg Gbur
MQ5 Frontiers in Optics (FiO) 2003
Mark A. Anastasio, Daxin Shi, Yin Huang, and Greg Gbur
FThP3 Frontiers in Optics (FiO) 2004
Daxin Shi and Mark A. Anastasio
FThM3 Frontiers in Optics (FiO) 2005