A two-beam random interferometer is demonstrated to have a second order speckle intensity frequency correlation with a ripple due to the path-length difference between the input beams and an envelope governed by the scattering medium.
© 2006 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(290.0290) Scattering : Scattering
(290.4210) Scattering : Multiple scattering
Z. Wang, A. M. Weiner, and K. J. Webb, "Interferometry in a Random Medium with Two Coincident Input Beams," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper FThJ3.
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