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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Spatially Variant Polarization Fields, Polarized Speckle Patterns, Polarized Vortices and Polarization Aberrations II (FThJ)

Interferometry in a Random Medium with Two Coincident Input Beams

Zhenyu Wang, Andrew M. Weiner, and Kevin J. Webb

http://dx.doi.org/10.1364/FIO.2006.FThJ3


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Abstract

A two-beam random interferometer is demonstrated to have a second order speckle intensity frequency correlation with a ripple due to the path-length difference between the input beams and an envelope governed by the scattering medium.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(290.0290) Scattering : Scattering
(290.4210) Scattering : Multiple scattering

Citation
Z. Wang, A. M. Weiner, and K. J. Webb, "Interferometry in a Random Medium with Two Coincident Input Beams," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper FThJ3.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2006-FThJ3


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