Spectral Self-interference Fluorescence Microscopy using two opposing high numerical aperture objectives is proposed to precisely measure the axial position of fluorescent emitters. 5 nm change in the position of monolayer of fluorescent emitters was measured.
© 2006 Optical Society of America
(170.0170) Medical optics and biotechnology : Medical optics and biotechnology
(170.2520) Medical optics and biotechnology : Fluorescence microscopy
(180.0180) Microscopy : Microscopy
(180.3170) Microscopy : Interference microscopy
M. Dogan, B. B. Goldberg, A. K. Swan, and M. S. Unlu, "4Pi Spectral Self-Interference Fluorescence Microscopy," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper FTuW2.
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