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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Joint FiO/LS Poster Session II (JWD)

Photoelastic Modulated Imaging Ellipsometry in Surface Plasmon Resonance Detection

Yu-Faye Chao, Hsiu-Ming Tsai, and Chien-Yuan Han

http://dx.doi.org/10.1364/FIO.2006.JWD11


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Abstract

The photoelastic modulated (PEM) imaging ellipsometry is used to measure the immobilization of Protein A on biochip through the micro-channel. Its lateral and temporal resolution of ellipsometric parameters are 4μm and 13sec, respectively.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(240.0240) Optics at surfaces : Optics at surfaces
(240.6680) Optics at surfaces : Surface plasmons

Citation
Y. Chao, H. Tsai, and C. Han, "Photoelastic Modulated Imaging Ellipsometry in Surface Plasmon Resonance Detection," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JWD11.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2006-JWD11


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