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  • Frontiers in Optics 2007/Laser Science XXIII/Organic Materials and Devices for Displays and Energy Conversion
  • OSA Technical Digest (CD) (Optica Publishing Group, 2007),
  • paper FWP2
  • https://doi.org/10.1364/FIO.2007.FWP2

In-situ Raman measurement of an individual Silicon nanowire trapped using optoelectronic tweezers (OET)

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Abstract

We demonstrate in-situ Raman measurements of individual silicon nanowires (100 nm diameter, 10-20 μm in length) which are trapped using optoelectronic tweezers (OET).

© 2007 Optical Society of America

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