Nano-porous thin films grown using oblique-angle electron-beam evaporation are found to exhibit birefringence in addition to ultra-low refractive index. The properties of SiO2and TiO2films grown using this method are presented in this paper.
© 2008 The Optical Society
M. Pan, A. Sarangan, and Q. Zhan, "Optical Birefringence of Nano-porous Dielectric Thin Films," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper FThR2.
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