New Developments in STED Microscopy

Stefan W. Hell; Alexander Egner; Roman Schmidt

doi:10.1364/FIO.2008.FTuS1

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper FTuS1
•https://doi.org/10.1364/FIO.2008.FTuS1

New Developments in STED Microscopy

Stefan W. Hell, Alexander Egner, and Roman Schmidt

Frontiers in Optics 2008

Rochester, New York United States
19–23 October 2008
ISBN: 978-1-55752-861-2

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Microscopy Superresolution and Source Engineering I (FTuS)

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S. W. Hell, A. Egner, and R. Schmidt, "New Developments in STED Microscopy," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper FTuS1.

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Abstract

I will discuss novel physical concepts that radically break the diffraction barrier in focusing fluorescence microscopy. They share a common strategy: exploiting molecular transitions of the fluorescent marker to neutralize the limiting role of diffraction.

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