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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 19-23, 2008
ISBN: 978-1-55752-861-2
Optics and Instrumentation for Next-Generation Sources I (FWN)

Focused X-Ray Beam Characterization by Phase Retrieval with a Moveable Phase-Shifting Structure

Manuel Guizar-Sicairos and James R. Fienup

http://dx.doi.org/10.1364/FIO.2008.FWN3


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Abstract

Characterization of focused x-ray beams by phase retrieval is addressed. We introduce diversity to the phase retrieval problem in a practical way by translating a phase-shifting structure relative to the beam, allowing for superior reconstructions.

© 2008 The Optical Society

OCIS Codes
(100.0100) Image processing : Image processing
(100.5070) Image processing : Phase retrieval
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.3295) Lasers and laser optics : Laser beam characterization

Citation
M. Guizar-Sicairos and J. R. Fienup, "Focused X-Ray Beam Characterization by Phase Retrieval with a Moveable Phase-Shifting Structure," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper FWN3.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2008-FWN3


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