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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 19-23, 2008
ISBN: 978-1-55752-861-2
Optics and Instrumentation for Next-Generation Sources I (FWN)

Characterization of Focused Soft X-Ray Laser Beams: Comparing their Ablative Imprints with Other Methods

Libor Juha, Jaromir Chalupsky, and Vera Hajkova

http://dx.doi.org/10.1364/FIO.2008.FWN4


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Abstract

The surface damage was investigated on suitable material to infer the focused beam characteristics of soft x-ray lasers. The method was tested with the beam of FLASH (Free-Electron LASer in Hamburg).

© 2008 The Optical Society

OCIS Codes
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers

Citation
L. Juha, J. Chalupsky, and V. Hajkova, "Characterization of Focused Soft X-Ray Laser Beams: Comparing their Ablative Imprints with Other Methods," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper FWN4.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2008-FWN4

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