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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 19-23, 2008
ISBN: 978-1-55752-861-2
Optics and Instrumentation for Next-Generation Sources II (FWU)

Integration of the Two-Dimensional Power Spectral Density into Specifications for the X-Ray Domain--Problems and Opportunities

Wayne R. McKinney, Malcolm R. Howells, and Valeriy V. Yashchuk

http://dx.doi.org/10.1364/FIO.2008.FWU2


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Abstract

An implementation of the two-dimensional statistical scattering theory for the prediction of scattering from x-ray mirrors is presented with a graphical user interface. This development has clarified several problems which are of interest to synchrotrons.

© 2008 The Optical Society

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(340.0340) X-ray optics : X-ray optics
(340.6720) X-ray optics : Synchrotron radiation

Citation
W. R. McKinney, M. R. Howells, and V. V. Yashchuk, "Integration of the Two-Dimensional Power Spectral Density into Specifications for the X-Ray Domain--Problems and Opportunities," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper FWU2.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2008-FWU2


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