Nano-Spectroscopy in the 2.5-10 μm Wavelength Range Using Atomic Force Microscope

K. L. Vodopyanov; G.A. Hill; J.H. Rice; S.R. Meech; D.Q.M. Craig; M. Reading; A. Dazzi; K. Kjoller; C. Prater

doi:10.1364/FIO.2009.FMK2

Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest
OSA Technical Digest (CD) (Optica Publishing Group, 2009),
paper FMK2
•https://doi.org/10.1364/FIO.2009.FMK2

Nano-Spectroscopy in the 2.5-10 μm Wavelength Range Using Atomic Force Microscope

K. L. Vodopyanov, G.A. Hill, J.H. Rice, S.R. Meech, D.Q.M. Craig, M. Reading, A. Dazzi, K. Kjoller, and C. Prater

Frontiers in Optics 2009

San Jose, California United States
11–15 October 2009
ISBN: 978-1-55752-878-0

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Microscopy and OCT I (FMK)

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K. L. Vodopyanov, G. A. Hill, J. H. Rice, S. R. Meech, D. Q. M. Craig, M. Reading, A. Dazzi, K. Kjoller, and C. Prater, "Nano-Spectroscopy in the 2.5-10 μm Wavelength Range Using Atomic Force Microscope," in Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest, OSA Technical Digest (CD) (Optica Publishing Group, 2009), paper FMK2.

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Abstract

We performed nanoscale atomic force microscope surface imaging with chemical identification and spatial resolution of 200 nm. The detection mechanism was based on recording resonant oscillations in the cantilever induced by a tunable mid-IR excitation.

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