We investigated Fabry-Perot type interference from optical wafers to measure the refractive indices. This method is accurate (~10<sup>-5</sup>for fused silica), insensitive to environmental perturbation, and simple to implement, compared to the conventional index-measurement methods.
© 2009 OSA
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5710) Instrumentation, measurement, and metrology : Refraction
H. J. Choi, H. H. Lim, I. Bae, H. S. Moon, M. Cha, T. B. Eom, and J. J. Ju, "Accurate Measurement of Refractive Indices of Optical Wafers by Using Fabry-Perot Type Interference," in Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest, OSA Technical Digest (CD) (Optical Society of America, 2009), paper JWC11.
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