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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 24-28, 2010
FiO Postdeadline Session I (PDPA)

Total Internal Reflection Microscopy: Calibration of the Intensity-Position Relation

Giovanni Volpe, Thomas Brettschneider, Laurent Helden, and Clemens Bechinger

http://dx.doi.org/10.1364/FIO.2010.PDPA1


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Abstract

TIRM measures particle-wall interaction potentials with nanometer and femtonewton resolution. Crucial is the knowledge of the scattering intensity-position relation I(z), usually assumed a priori exponential. The experimental determination of I(z) greatly enlarges the accessible conditions.

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(260.0260) Physical optics : Physical optics
(260.6970) Physical optics : Total internal reflection

Citation
G. Volpe, T. Brettschneider, L. Helden, and C. Bechinger, "Total Internal Reflection Microscopy: Calibration of the Intensity-Position Relation," in Frontiers in Optics 2010/Laser Science XXVI, OSA Technical Digest (CD) (Optical Society of America, 2010), paper PDPA1.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2010-PDPA1


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