The compact silicon diffractive sensor platform is experimentally characterized. This configuration is independent of interaction length and attenuation and capable of measuring refractive index changes of 10^-8 without spectral measurement.
© 2011 OSA
J. S. Maikisch and T. K. Gaylord, "Compact Silicon Diffractive Sensor Characterization," in Frontiers in Optics 2011/Laser Science XXVII, OSA Technical Digest (Optical Society of America, 2011), paper FThN3.
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