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Conference Paper
Frontiers in Optics
San Jose, California United States
October 16-20, 2011
ISBN: 978-1-55752-917-6
Silicon Microphotonic Devices (FThN)

Compact Silicon Diffractive Sensor Characterization

Jonathan S. Maikisch and Thomas K. Gaylord  »View Author Affiliations


http://dx.doi.org/10.1364/FIO.2011.FThN3


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Abstract

The compact silicon diffractive sensor platform is experimentally characterized. This configuration is independent of interaction length and attenuation and capable of measuring refractive index changes of 10^-8 without spectral measurement.

© 2011 OSA

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(130.0130) Integrated optics : Integrated optics
(130.6010) Integrated optics : Sensors

Citation
J. S. Maikisch and T. K. Gaylord, "Compact Silicon Diffractive Sensor Characterization," in Frontiers in Optics 2011/Laser Science XXVII, OSA Technical Digest (Optical Society of America, 2011), paper FThN3.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2011-FThN3


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