We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.
© 2012 OSA
W. P. Grice, D. Earl, P. G. Evans, D. Guo, T. Humble, E. Martin, and R. C. Pooser, "Beam Profiler for Single-Photon Applications based on Compressive Sampling Techniques," in Frontiers in Optics 2012/Laser Science XXVIII, OSA Technical Digest (online) (Optical Society of America, 2012), paper FW4J.5.
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