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Conference Paper
Frontiers in Optics
Rochester, New York United States
October 14-18, 2012
ISBN: 978-1-55752-956-5
Quantum Measurements (FW4J)

Beam Profiler for Single-Photon Applications based on Compressive Sampling Techniques

Warren P. Grice, Duncan Earl, Philip G. Evans, Dong-Sheng Guo, Travis Humble, Eric Martin, and Raphael C. Pooser  »View Author Affiliations


http://dx.doi.org/10.1364/FIO.2012.FW4J.5


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Abstract

We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

© 2012 OSA

OCIS Codes
(040.3780) Detectors : Low light level
(270.5570) Quantum optics : Quantum detectors

Citation
W. P. Grice, D. Earl, P. G. Evans, D. Guo, T. Humble, E. Martin, and R. C. Pooser, "Beam Profiler for Single-Photon Applications based on Compressive Sampling Techniques," in Frontiers in Optics 2012/Laser Science XXVIII, OSA Technical Digest (online) (Optical Society of America, 2012), paper FW4J.5.
http://www.opticsinfobase.org/abstract.cfm?URI=FiO-2012-FW4J.5


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