Metamaterial characterization using structured light

Jinwei Zeng; Jingbo Sun; Xi Wang; Alexander N. Cartwright; Natalia M. Litchinitser

doi:10.1364/FIO.2013.FTu1F.2

Frontiers in Optics 2013
OSA Technical Digest (online) (Optica Publishing Group, 2013),
paper FTu1F.2
•https://doi.org/10.1364/FIO.2013.FTu1F.2

Metamaterial characterization using structured light

Jinwei Zeng, Jingbo Sun, Xi Wang, Alexander N. Cartwright, and Natalia M. Litchinitser

Frontiers in Optics 2013

Orlando, Florida United States
6–10 October 2013
ISBN: 978-1-55752-987-9

From the session
Unconventional Polarization and Complex Optical Fields II (FTu1F)

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J. Zeng, J. Sun, X. Wang, A. N. Cartwright, and N. M. Litchinitser, "Metamaterial characterization using structured light," in Frontiers in Optics 2013, I. Kang, D. Reitze, N. Alic, and D. Hagan, eds., OSA Technical Digest (online) (Optica Publishing Group, 2013), paper FTu1F.2.

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Abstract

We propose and demonstrate a technique for characterization of optical metamaterials, metasurfaces, and ultra-thin films based on the interferometry employing optical vortices. This tool may find applications in the general area of optical nanostructure characterization.

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