We demonstrate a novel technique for the complete reconstruction of two electric fields in multiple dimensions using multiple-shearing interferometry. The method does not require the fields to be identical and is highly robust to noise.
© 2013 OSA
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
M. M. Mang, C. Bourassin-Bouchet, I. Gianani, and I. A. Walmsley, "Mutual Interferometric Characterization of Electric-fields," in Frontiers in Optics 2013, I. Kang, D. Reitze, N. Alic, and D. Hagan, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper FTu4F.2.
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