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Conference Paper
International Optical Design Conference
Vancouver Canada
June 4, 2006
ISBN: 1-55752-811-X
Aberration Theory (MC)

General Sine Condition for Plane-Symmetric Imaging Systems and Some Example Aplanatic Designs

Chunyu Zhao

http://dx.doi.org/10.1364/IODC.2006.MC3


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Abstract

General sine condition for plane-symmetric imaging system has been derived before. Here we present some special types of plane-symmetric aplanatic imaging systems to show the effectiveness of the condition.

© 2006 Optical Society of America

OCIS Codes
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.1010) Optical design and fabrication : Aberrations (global)
(220.3620) Optical design and fabrication : Lens system design

Citation
C. Zhao, "General Sine Condition for Plane-Symmetric Imaging Systems and Some Example Aplanatic Designs," in International Optical Design, Technical Digest (CD) (Optical Society of America, 2006), paper MC3.
http://www.opticsinfobase.org/abstract.cfm?URI=IODC-2006-MC3


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