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Conference Paper
International Optical Design Conference
Jackson Hole, Wyoming United States
June 13-17, 2010
ISBN: 978-1-55752-893-3
Design and Analysis Considerations for Optical System Fabrication and Testing (ITuD)

Use of the Abbe Sine Condition to Quantify Alignment Aberrations in Optical Imaging Systems

James H. Burge, Chunyu Zhao, and Matt B. Dubin

http://dx.doi.org/10.1364/IODC.2010.ITuD5


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Abstract

Violation of Abbe’s sine condition is well known to cause coma in axisymmetric imaging systems. We define non-symmetric violations and show how they come from misaligned optical systems and how they cause image degradations.

© 2010 OSA, SPIE

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.1010) Optical design and fabrication : Aberrations (global)
(110.3925) Imaging systems : Metrics

Citation
J. H. Burge, C. Zhao, and M. B. Dubin, "Use of the Abbe Sine Condition to Quantify Alignment Aberrations in Optical Imaging Systems," in International Optical Design Conference and Optical Fabrication and Testing , OSA Technical Digest (CD) (Optical Society of America, 2010), paper ITuD5.
http://www.opticsinfobase.org/abstract.cfm?URI=IODC-2010-ITuD5


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