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Conference Paper
Information Photonics
Charlotte, North Carolina United States
June 6, 2005
ISBN: 1-55752-789-X
Interconnects II (IThA)

Scaling VCSEL Reliability Up to 250Terabits/s of System Bandwidth

John E. Cunningham, D Beckman, D McElfresh, C Forrest, D Cohen, and A V. Krishnamoorthy


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We evaluate VCSEL reliability for next-generation High Productivity Computers in which several hundreds of terabits of bandwidth are envisioned. VSCEL sparing, water-cooling and redundancy though percentage of link failures are analyzed.

© 2005 Optical Society of America

OCIS Codes
(200.0200) Optics in computing : Optics in computing
(200.4650) Optics in computing : Optical interconnects
(250.0250) Optoelectronics : Optoelectronics
(250.7260) Optoelectronics : Vertical cavity surface emitting lasers

J. E. Cunningham, D. Beckman, D. McElfresh, C. Forrest, D. Cohen, and A. V. Krishnamoorthy, " Scaling VCSEL Reliability Up to 250Terabits/s of System Bandwidth," in Adaptive Optics: Analysis and Methods/Computational Optical Sensing and Imaging/Information Photonics/Signal Recovery and Synthesis Topical Meetings on CD-ROM, Technical Digest (Optical Society of America, 2005), paper IThA3.

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