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Transmission measurement of tapered single line defect photonic crystal waveguide

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Abstract

Two-dimensional single line defect Photonic Crystal waveguides were fabricated in InP/InGaAsP and characterized by optical transmission measurements. Two different PC waveguide tapers were investigated for coupling to access ridge waveguides; a ~10-dB improvement of coupling efficiency was observed over un-tapered waveguides.

© 2004 Optical Society of America

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