We have observed a large birefringence of 0.039 in annealed Si-rich SiO2 thin films deposited on silica substrates. The birefringence is correlated with the light emission and structural properties of the films.
© 2006 Optical Society of America
M. A. Stolfi, L. Dal Negro, J. Michel, X. Duan, L. C. Kimerling, and J. Haavisto, "Anomalous Birefringence in Annealed Si-Rich Silicon Dioxide," in Integrated Photonics Research and Applications/Nanophotonics, Technical Digest (CD) (Optical Society of America, 2006), paper IMB5.
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