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Conference Paper
Integrated Photonics Research and Applications
Uncasville, Connecticut
April 24, 2006
Low Index Contrast Devices (IMB)

Anomalous Birefringence in Annealed Si-Rich Silicon Dioxide

Michael A. Stolfi, Luca Dal Negro, Jurgen Michel, Xiaoman Duan, Lionel C. Kimerling, and John Haavisto


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We have observed a large birefringence of 0.039 in annealed Si-rich SiO2 thin films deposited on silica substrates. The birefringence is correlated with the light emission and structural properties of the films.

© 2006 Optical Society of America

OCIS Codes
(160.0160) Materials : Materials
(160.3130) Materials : Integrated optics materials
(260.0260) Physical optics : Physical optics
(260.1440) Physical optics : Birefringence

M. A. Stolfi, L. Dal Negro, J. Michel, X. Duan, L. C. Kimerling, and J. Haavisto, "Anomalous Birefringence in Annealed Si-Rich Silicon Dioxide," in Integrated Photonics Research and Applications/Nanophotonics, Technical Digest (CD) (Optical Society of America, 2006), paper IMB5.

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