Abstract
Speckle patterns measured as a function of frequency are used to describe the polarization properties for scattering samples. We demonstrate differences in the degree of polarization and frequency resolved correlations for differing amounts of scatter.
© 2004 Optical Society of America
PDF ArticleMore Like This
Z. Wang, M. A. Webster, A. M. Weiner, and K. J. Webb
FTuD7 Frontiers in Optics (FiO) 2004
Z. Wang, M. A. Webster, A. M. Weiner, and K. J. Webb
QTuF4 Quantum Electronics and Laser Science Conference (CLEO:FS) 2006
Chad E. Bigelow and Thomas H. Foster
FTuG42 Frontiers in Optics (FiO) 2004