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Conferences > IQEC > 2004 > ITuD > ITuD3
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper ITuD3
  • •https://doi.org/10.1364/IQEC.2004.ITuD3

Two-beam second-harmonic generation for precise and self-consistent characterization of thin films

Stefano Cattaneo and Martti Kauranen

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Abstract

Second-harmonic generation using two fundamental beams, instead of one, offers significant advantages for characterizing nonlinear optical thin films. The new technique is more precise and allows verification of the internal consistency of the results.

© 2004 Optical Society of America

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