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Conference Paper
International Quantum Electronics Conference
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
Nano-Optics and Opto-Mechanics (IMG)

Broadband Heterodyne NSOM Characterization of Propagation Loss in Waveguide Bends

Maurice Ayache, Maxim Abashin, Dawn T. Tan, and Yeshaiahu Fainman


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We use a heterodyne NSOM with superluminescent diode illumination to measure the loss in an SOI waveguide around a bend. For a bend of radius 10 μm, we measure loss of .09 dB.

© 2009 The Optical Society

OCIS Codes
(180.0180) Microscopy : Microscopy
(230.0230) Optical devices : Optical devices
(230.7370) Optical devices : Waveguides
(180.4243) Microscopy : Near-field microscopy

M. Ayache, M. Abashin, D. T. Tan, and Y. Fainman, "Broadband Heterodyne NSOM Characterization of Propagation Loss in Waveguide Bends," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper IMG5.

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